Surface Analysis

  • XPS (X-ray Photoelectron Spectroscopy)
  • Dynamic SIMS (Secondary Ion Mass Spectrometry)
  • ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry)
  • WLI (White Light Interferometry)
  • SEM/EDX (Scanning Electron Microscopy/Energy Dispersive Analysis)
  • DSEM (Three Dimensional Scanning Electron Microscopy)
  • XRD (X-Ray Diffraction)
  • FTIR (Fourier Transform Infrared Analysis)
  • AFM (Atomic Force Microscopy)
  • TEM (Transmission Electron Microscopy)
  • Raman Spectroscopy

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